Publication Detail

Authors of Publication	Khalid M, Riaz S, Grekov AE, Santi E and Naseem S
Title of Publication	‘High breakdown voltage characteristics in normally-off 4H-SiC VJFET using TCAD simulation”
Name of Journal	Materials Today: Proceedings
Volume	2
Impact Factor (IF)	-
Hec Recognization	Yes
Other	-
Conference Proceeding	Yes
Year of Publish	2015

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