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Publication Detail

Authors of Publication Khalid M, Riaz S, Grekov AE, Santi E and Naseem S
Title of Publication ‘High breakdown voltage characteristics in normally-off 4H-SiC VJFET using TCAD simulation”
Name of Journal Materials Today: Proceedings
Volume 2
Impact Factor (IF) -
Hec Recognization Yes
Other -
Conference Proceeding Yes
Year of Publish 2015