
Publication Detail
Authors of Publication | Munir T, Abbas F, Naseem S and Raza W |
---|---|
Title of Publication | “Effect of Channel width on breakdown analysis of normally-Off 4H-SiC trenched and implanted VJFET” |
Name of Journal | Materials Today: Proceeding |
Volume | 2 |
Impact Factor (IF) | - |
Hec Recognization | Yes |
Other | - |
Conference Proceeding | Yes |
Year of Publish | 2015 |