Entry Test Result 2019 Careers - Jobs in Centre 2019 Tender Notice Research Productivity Award - 2016 ISO 9001:2008 Certified Merit List - 2018

Publication Detail

Authors of Publication Munir T, Abbas F, Naseem S and Raza W
Title of Publication “Effect of Channel width on breakdown analysis of normally-Off 4H-SiC trenched and implanted VJFET”
Name of Journal Materials Today: Proceeding
Volume 2
Impact Factor (IF) -
Hec Recognization Yes
Other -
Conference Proceeding Yes
Year of Publish 2015